Atomic force microscope (JPK NanoWizard)

It is situated in our microscopy lab. The instrument allows microscopy in liquids and is situated on an inverted fluorescence microscope.

Additional options compared to Veeco Dimension 3100: Force distance curve measurements; heatable sample stage; EFM (electrical scanning microscopy).

Top and bottom optical inspection is possible.


The image on the left demonstrates a surface as seen under the AFM. On the right hand side you find the same surface as monitored by the Interference microscope.

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